发明名称 SEAL FOR SEMICONDUCTOR-MANUFACTURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide the seal for semiconductor-manufacturing apparatus, excellent in oxygen plasma-resistant characteristics, gas-permeability and sealing properties. SOLUTION: This seal for the semiconductor-manufacturing apparatus is characterized in that 40-150 pts.wt. barium sulfate is compounded with 100 pts.wt. vinylidene fluoride-hexafluoropropylene copolymer and/or vinylidene fluoride-hexafluoropropylene-tetrafluoroethylene copolymer while regulating the amount of inorganic materials except the barium sulfate so as to be <=1 pts.wt. to provide a composition, and the resultant composition is cross-linked by an organic peroxide. The seal for the semiconductor-manufacturing apparatus is also obtained by compounding 0.5-30 pts.wt. tetrafluoroethylene resin with the before composition.
申请公布号 JP2001192643(A) 申请公布日期 2001.07.17
申请号 JP20000001045 申请日期 2000.01.06
申请人 MITSUBISHI CABLE IND LTD 发明人 KOBIKI KAZUHIKO;MIYASHIRO HIROKI
分类号 C09K3/10;C08F14/22;C08L27/16;C09J127/20;(IPC1-7):C09K3/10 主分类号 C09K3/10
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