| 摘要 |
PURPOSE: A method and a structure for testing embedded analog/mixed-signal cores in a system-on-a-chip are provided to have a microprocessor core and a memory core. CONSTITUTION: The method comprises a step for providing a register for test between a microprocessor core and an analog core to be tested in an integrated circuit chip, a step for testing the microprocessor core and a memory core, a step for executing an assembly language program in the microprocessor core, and for generating a test pattern by the microprocessor core, and a step for applying the test pattern to the analog core by the microprocessor core, and for inspecting the response of the analog core by the microprocessor or a test system provided outside the integrated circuit chip.
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