发明名称 METHOD OF MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method of manufacturing a capacitor is to form an oxide layer of SiON on a surface of a lower electrode using a prescribed cleaning process, while forming oxide layer having a work function greater than that of the lower electrode, thereby improving a leakage current characteristic of an Al2O3 capacitor. CONSTITUTION: A junction region(2) and an insulating layer(3) are sequentially formed on a semiconductor substrate(1) and a contact hole is formed therein exposing the junction region. A lower electrode(5) is then formed on the entire surface including the contact hole to be connected with the junction region, and then a thin oxide layer(6) of SiON is formed thereon with a cleaning process using HF and SC1 as a cleaning solution. A nitride layer(7) is then formed on the oxide layer. Thereafter, a dielectric layer(8) of Al2O3 is deposited on the entire surface including the nitride layer, followed by depositing an upper electrode(9) thereon.
申请公布号 KR20010065299(A) 申请公布日期 2001.07.11
申请号 KR19990065172 申请日期 1999.12.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, GYEONG MIN;KIM, MIN SU;LIM, CHAN
分类号 H01L21/283;(IPC1-7):H01L21/283 主分类号 H01L21/283
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