发明名称 |
METHOD OF MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method of manufacturing a capacitor is to form an oxide layer of SiON on a surface of a lower electrode using a prescribed cleaning process, while forming oxide layer having a work function greater than that of the lower electrode, thereby improving a leakage current characteristic of an Al2O3 capacitor. CONSTITUTION: A junction region(2) and an insulating layer(3) are sequentially formed on a semiconductor substrate(1) and a contact hole is formed therein exposing the junction region. A lower electrode(5) is then formed on the entire surface including the contact hole to be connected with the junction region, and then a thin oxide layer(6) of SiON is formed thereon with a cleaning process using HF and SC1 as a cleaning solution. A nitride layer(7) is then formed on the oxide layer. Thereafter, a dielectric layer(8) of Al2O3 is deposited on the entire surface including the nitride layer, followed by depositing an upper electrode(9) thereon.
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申请公布号 |
KR20010065299(A) |
申请公布日期 |
2001.07.11 |
申请号 |
KR19990065172 |
申请日期 |
1999.12.29 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, GYEONG MIN;KIM, MIN SU;LIM, CHAN |
分类号 |
H01L21/283;(IPC1-7):H01L21/283 |
主分类号 |
H01L21/283 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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