发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to prevent an electrical short-circuit by forming a plug layer through various planarization processes. CONSTITUTION: A multitude of word line having the first insulating layer sidewall(34) and the second insulating layer(33) is formed on a substrate(31). The third insulating layer is formed on the whole structure. The third insulating layer(36) is etched to expose a part of the substrate(31) for forming a plug layer(39a). A conductive layer for forming a plug is formed on the whole structure. The conductive layer is flattened by using the third insulating layer(36) as an etch-stopper. The conductive layer of the word line is etched by using the second insulating layer(33) as the etch-stopper. A multitude of plug layer(39a) is formed by flattening the third insulating layer(36) and the conductive layer.
申请公布号 KR20010063779(A) 申请公布日期 2001.07.09
申请号 KR19990061867 申请日期 1999.12.24
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, YEONG SEO;NA, JIN SEOK
分类号 H01L21/8232;(IPC1-7):H01L21/823 主分类号 H01L21/8232
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