发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device is provided to prevent an electrical short-circuit by forming a plug layer through various planarization processes. CONSTITUTION: A multitude of word line having the first insulating layer sidewall(34) and the second insulating layer(33) is formed on a substrate(31). The third insulating layer is formed on the whole structure. The third insulating layer(36) is etched to expose a part of the substrate(31) for forming a plug layer(39a). A conductive layer for forming a plug is formed on the whole structure. The conductive layer is flattened by using the third insulating layer(36) as an etch-stopper. The conductive layer of the word line is etched by using the second insulating layer(33) as the etch-stopper. A multitude of plug layer(39a) is formed by flattening the third insulating layer(36) and the conductive layer.
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申请公布号 |
KR20010063779(A) |
申请公布日期 |
2001.07.09 |
申请号 |
KR19990061867 |
申请日期 |
1999.12.24 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, YEONG SEO;NA, JIN SEOK |
分类号 |
H01L21/8232;(IPC1-7):H01L21/823 |
主分类号 |
H01L21/8232 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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