发明名称 |
METHOD OF FLATTENING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A flattening method for semiconductor device is provided to enhance insulation features among devices by forming a polymer insulation film while increasing polishing speed. CONSTITUTION: Conductive lines(23) are formed on a semiconductor substrate(21). A polymer insulation film(25) is formed on the whole surface. The polymer insulation film(25) is heat-treated using nitride. The heat treatment is performed for 5 to 50 minutes at 200 to 500deg.C under nitride atmosphere. Boron, Phosphorous or Arsenic ion is injected to the polymer insulation film(25). C-B, P or As-H bonding is formed to have larger polishing speed than C-H bonding in the polymer insulation film(25). The polymer insulation film(25) is flattened through Chemical Mechanical Polishing using acid slurry of pH 2 to 6 and a polishing material with size of 0.03 to 0.7 microns.
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申请公布号 |
KR20010061126(A) |
申请公布日期 |
2001.07.07 |
申请号 |
KR19990063612 |
申请日期 |
1999.12.28 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
OH, CHAN GWON;YANG, GI HONG |
分类号 |
H01L21/31;(IPC1-7):H01L21/31 |
主分类号 |
H01L21/31 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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