发明名称 METHOD OF FLATTENING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A flattening method for semiconductor device is provided to enhance insulation features among devices by forming a polymer insulation film while increasing polishing speed. CONSTITUTION: Conductive lines(23) are formed on a semiconductor substrate(21). A polymer insulation film(25) is formed on the whole surface. The polymer insulation film(25) is heat-treated using nitride. The heat treatment is performed for 5 to 50 minutes at 200 to 500deg.C under nitride atmosphere. Boron, Phosphorous or Arsenic ion is injected to the polymer insulation film(25). C-B, P or As-H bonding is formed to have larger polishing speed than C-H bonding in the polymer insulation film(25). The polymer insulation film(25) is flattened through Chemical Mechanical Polishing using acid slurry of pH 2 to 6 and a polishing material with size of 0.03 to 0.7 microns.
申请公布号 KR20010061126(A) 申请公布日期 2001.07.07
申请号 KR19990063612 申请日期 1999.12.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 OH, CHAN GWON;YANG, GI HONG
分类号 H01L21/31;(IPC1-7):H01L21/31 主分类号 H01L21/31
代理机构 代理人
主权项
地址