发明名称 METHOD OF CLEANING SEMICONDUCTOR SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To remove metallic impurities, attached fine particles, and organic matters from the surface of a substrate in a one-time washing at a low cost. SOLUTION: An ozone gas 12 is continuously or intermittently supplied into an alkaline aqueous solution 11 of pH 8-14 such as a potassium hydroxide, sodium hydroxide, lithium hydroxide, or ammonia aqueous solution, at a rate of 1-1,000 mg per min. per 1 liter of the aqueous solution to prepare washings 10 for a semiconductor substrate. This method of cleaning a semiconductor substrate consists of a process of dipping a semiconductor substrate 13 in the prepared washings 10 for 1 to 30 min. and a process of rinsing the semiconductor substrate 13 with pure water 16.
申请公布号 JP2001185521(A) 申请公布日期 2001.07.06
申请号 JP19990366385 申请日期 1999.12.24
申请人 MITSUBISHI MATERIALS SILICON CORP 发明人 TAKAISHI KAZUNARI;HATANO KEIJI
分类号 B08B3/08;H01L21/304;H01L21/306;(IPC1-7):H01L21/304 主分类号 B08B3/08
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