发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICES |
摘要 |
PURPOSE: A method for manufacturing semiconductor devices is provided to reduce generation of a conventional etch pit phenomenon to minimize a stress applied on a silicon substrate, by adequately forming a layout of poly 1 and a device isolation active region on the silicon substrate. CONSTITUTION: A method for manufacturing semiconductor devices makes the angle of a corner portion in an active region(1) an obtuse angle so that the final profile can be rounded upon layout of the active region on a silicon substrate.
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申请公布号 |
KR20010059532(A) |
申请公布日期 |
2001.07.06 |
申请号 |
KR19990067049 |
申请日期 |
1999.12.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
BAE, GYEONG JIN;KIM, JONG HWAN |
分类号 |
H01L21/336;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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