摘要 |
PURPOSE: A method for marking and analyzing a defect in a thin film hard disk is provided to precisely and accurately analyze the nature of a defect by making the location of the defect visible. CONSTITUTION: A hard disk is disposed in a disk drive and the disk is formatted with sector identification lines and data written into data tracks(32). During the data writing process, a disk surface defect is identified by its sector, track and byte location(49). The hard disk is marked, and the defect is located at a later time. The erased bands aid in later locating the defect. After the defect locating erasures are completed for each defect found on the disks(52,56,62,66,74,92,108), the disk is removed from the hard disk for further analysis(116). The disk is placed on the stage of a microscope and ferromagnetic fluid is applied to the disk to make the erased tracks visible(126,128). The ferromagnetic fluid is applied out to the end of the track erasure of the track including the defect without application of ferromagnetic fluid to the defect itself(140). Accordingly, the specific defect is visually located for further analysis in its original condition without disk erasure over it and the application of ferromagnetic fluid upon it. Since the defect is in its original condition, a precise and accurate analysis of the nature of the defect is made.
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