发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a semiconductor device is to improve the characteristic of a cell transistor by implanting hydrogen into a cell. CONSTITUTION: The first interlayer dielectric(16) is formed on a semiconductor substrate(10) with a predetermined lower structure. The first interlayer dielectric has a plug ploy(15). The lower structure consists of an isolation insulating layer(11), a gate electrode(12), and a source/drain region(14). A bit line(17) is formed to be connected with the plug poly. The second interlayer dielectric(18) is formed on the entire structure. A storage electrode contact hole is formed to expose a storage electrode forming region of the plug poly. A storage electrode(19) is formed to be connected with the plug poly through the storage electrode contact hole. Then, a dielectric layer(20) and a plate electrode are formed on the storage electrode in this order. An HSG(hemi spherical glass)(22) is formed on plate electrode by using SiH4 gas within a low pressure chemical vapor deposition chamber. The HSG layer has a thickness of 300 to 400 angstroms.
申请公布号 KR20010058936(A) 申请公布日期 2001.07.06
申请号 KR19990066312 申请日期 1999.12.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHOI, DEUK SEONG;KIM, SEUNG WAN
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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