发明名称 MANUFACTURING METHOD OF CONTACT STRUCTURE
摘要 PROBLEM TO BE SOLVED: To obtain a contact structure while ensuring flatness without generating void in a layer insulation film. SOLUTION: A substrate 1 and a first layer insulation film 21 consisting of a p-TEOS covering a wiring 4 formed on the substrate 1 are deposited. Thereafter, a second layer insulation film 22 of application glass is formed by an SOG method. The second layer insulation film 22 is etched by etching back from an opposite side to the substrate 1. Etching is stopped when a surface 21a of the first layer insulation film 21 is exposed above the wiring 4 and flatness is ensured. Thereafter, a third insulation film 23 is laminated on the second insulation film 22 and an opening 51 is shaped by carrying out isotropic etching to the third insulation film 23 in an upper part of the wiring 4. In the process, the isotropic etching does not attain to the second insulation film 22.
申请公布号 JP2001185619(A) 申请公布日期 2001.07.06
申请号 JP19990370065 申请日期 1999.12.27
申请人 MITSUBISHI ELECTRIC CORP 发明人 KIDO SHIGENORI;MATSUFUSA JIRO;MAMETANI TOMOHARU;NAKADA YOJI;KISHIDA TAKESHI;NAGAI YUKIHIRO;KINUGASA AKINORI;NISHIMURA HIROAKI
分类号 H01L21/28;H01L21/768;(IPC1-7):H01L21/768 主分类号 H01L21/28
代理机构 代理人
主权项
地址