| 摘要 |
PURPOSE: A method for forming a fuse unit is provided to prevent defect caused by absorption of moisture when a reliability test is performed for a product. CONSTITUTION: A method for forming a fuse unit forms a fuse electrode(310) on a semiconductor substrate(300). Multi-layer metal layers(M1,M2,M3) are formed on a region other than a portion(b) from which the fuse electrode(310) will be cut. Multi-layer insulating films are intervened between the multi-layer metal layers(M1,M2,M3). An opening unit(B) from which the multi-layer insulating films are removed is formed on a portion(b) from which the fuse electrode(310) will be cut so that the fuse electrode(310) can be easily cut.
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