发明名称 Method and apparatus for measuring bias magnetic field for controlling magnetic domain of magnetoresistive effect element
摘要 A method for measuring bias magnetic field for controlling magnetic domain (longitudinal bias magnetic field) of a MR element has the step of applying an external measurement magnetic field onto the MR element which is biased with the magnetic field for controlling the magnetic domain (longitudinal bias magnetic field) in parallel to the direction of the bias magnetic field, the step of measuring rho-H loop of the MR element (output resistance of MR element versus magnetic field strength loop) under the application of the external measurement magnetic field, and the step of determining a shifted amount of the measured rho-H loop.
申请公布号 US6255814(B1) 申请公布日期 2001.07.03
申请号 US19990368672 申请日期 1999.08.05
申请人 TDK CORPORATION 发明人 SHIMAZAWA KOJI;ARAKI SATORU
分类号 G11B5/39;G01R33/09;G11B5/00;G11B5/455;(IPC1-7):G01R33/02 主分类号 G11B5/39
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