| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a semiconductor part storage tray whether the tray can be reused or not is accurately judged. SOLUTION: A plurality of pockets 3 for storing semiconductor parts 2 are provided vertically and horizontally on the tray 1. Strength deterioration measuring sections 4 for measuring the deterioration of strength of the tray 1 are provided in the vicinity of both ends in the longitudinal direction of the tray 1. A breaking strength value required for breaking the vicinity of the center of the strength deterioration measuring sections 4 is measured by a breaking instrument, and when the breaking strength value is larger than the reference strength value, the strength deterioration of the tray 1 is judged to be slight. As the frequency of reuse of the tray 1 is measured based on the number of holes in the strength deterioration measuring sections 4, the frequency of reuse of the tray 1 can be increased as many as possible within the range of not generating troubles of the carriage of semiconductor parts 2. A part of the semiconductor part storage tray is scooped out into the U-shape to form a stretching and contracting member and a warping member, and whether the tray can be reused or not is judged based on the stretching and contracting amount of the stretching and contracting member and the warping amount of the warping member.</p> |
