摘要 |
PROBLEM TO BE SOLVED: To provide a system and a method for testing IC, which can efficiently prepare a program required for a test. SOLUTION: Each of test programs for IC test is stored in a program managing directory 13 of a host system 10 as an archive 13a together with an archive managing file 13b, and corresponding to a program designating instruction, the archive 13a and the archive managing file 13b are transferred from the host system 10 to a testing device 20. The testing device 20 stores the archive 13a and the archive managing file 13b in a temporary directory 21 and stores a file, with which the archive 13a is expanded, in a product directory 22. When starting the test, the file of the test program stored in the product directory 22 is installed in a main storage device 23 and the test is started.
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