发明名称 SYSTEM AND METHOD FOR TESTING IC
摘要 PROBLEM TO BE SOLVED: To provide a system and a method for testing IC, which can efficiently prepare a program required for a test. SOLUTION: Each of test programs for IC test is stored in a program managing directory 13 of a host system 10 as an archive 13a together with an archive managing file 13b, and corresponding to a program designating instruction, the archive 13a and the archive managing file 13b are transferred from the host system 10 to a testing device 20. The testing device 20 stores the archive 13a and the archive managing file 13b in a temporary directory 21 and stores a file, with which the archive 13a is expanded, in a product directory 22. When starting the test, the file of the test program stored in the product directory 22 is installed in a main storage device 23 and the test is started.
申请公布号 JP2001175526(A) 申请公布日期 2001.06.29
申请号 JP19990361752 申请日期 1999.12.20
申请人 ANDO ELECTRIC CO LTD 发明人 ARATAKE AKIHIRO
分类号 G01R31/26;G01R31/28;G06F9/445;G06F11/22;G06F12/00 主分类号 G01R31/26
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