发明名称 ILLUMINANCE METER, ILLUMINANCE MEASURING METHOD, EXPOSING DEVICE, EXPOSING METHOD, DEVICE MANUFACTURING METHOD, AND SUBSTRATE HOLDER
摘要 PROBLEM TO BE SOLVED: To place the probe of an illuminance meter on a substrate stage easily. SOLUTION: As the shape of the measuring plate 9 of an illuminance meter 8 is equal to that of a substrate holder or substrate, it is possible to use a replacing device, robot, etc., for replacing substrate holders or substrates for replacing the measuring plate 9. Therefor, there is no need for an operator to place the measuring plate 9 on a substrate stage directly with his hand, and it is possible to place the measuring plate 9 as a probe on the substrate stage easily and highly accurately.
申请公布号 JP2001165768(A) 申请公布日期 2001.06.22
申请号 JP20000295128 申请日期 2000.09.27
申请人 NIKON CORP 发明人 TSUJI TOSHIHIKO
分类号 G01J1/02;G03F7/20;H01L21/027;(IPC1-7):G01J1/02 主分类号 G01J1/02
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