发明名称 |
POSITIVE PHOTOSENSITIVE COMPOSITION |
摘要 |
PROBLEM TO BE SOLVED: To provide a positive photoresist composition which gives a resist pattern having high sensitivity and high resolution as <=0.15 μm and having a square cross section in the production of a semiconductor device and to provide a positive photoresist composition showing small dimensional shift when a pattern is transferred to a lower layer in an oxygen plasma etching process of a two-layer resist method. SOLUTION: The positive photoresist composition contains an acid- decomposable polymer which contains a silicon-containing recurring unit expressed by formula (I) and a recurring unit of a specified structure expressed by formula (II) and which increases the solubility with an alkali developer by the effect of an acid. |
申请公布号 |
JP2001166486(A) |
申请公布日期 |
2001.06.22 |
申请号 |
JP19990350505 |
申请日期 |
1999.12.09 |
申请人 |
FUJI PHOTO FILM CO LTD |
发明人 |
MIZUTANI KAZUYOSHI;SATO KENICHIRO |
分类号 |
H01L21/027;G03F7/039;G03F7/075 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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