发明名称 POSITIVE PHOTOSENSITIVE COMPOSITION
摘要 PROBLEM TO BE SOLVED: To provide a positive photoresist composition which gives a resist pattern having high sensitivity and high resolution as <=0.15 &mu;m and having a square cross section in the production of a semiconductor device and to provide a positive photoresist composition showing small dimensional shift when a pattern is transferred to a lower layer in an oxygen plasma etching process of a two-layer resist method. SOLUTION: The positive photoresist composition contains an acid- decomposable polymer which contains a silicon-containing recurring unit expressed by formula (I) and a recurring unit of a specified structure expressed by formula (II) and which increases the solubility with an alkali developer by the effect of an acid.
申请公布号 JP2001166486(A) 申请公布日期 2001.06.22
申请号 JP19990350505 申请日期 1999.12.09
申请人 FUJI PHOTO FILM CO LTD 发明人 MIZUTANI KAZUYOSHI;SATO KENICHIRO
分类号 H01L21/027;G03F7/039;G03F7/075 主分类号 H01L21/027
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