发明名称 LOOP BACK TEST SYSTEM AND METHOD FOR ASYMMETRICAL TRANSMITTER
摘要 <p>PROBLEM TO BE SOLVED: To provide a loop back test system and its method by which the loop back test of an asymmetrical transmitter, whose transmission rates are different for incoming direction and outgoing directions, can be attained. SOLUTION: This loop back test system for the asymmetrical transmitter that transmits data in two bidirectional manner at an outgoing transmission rate faster than an incoming transmission rate is provided with a loop back data transmission section 3A that transmits loop back data as outgoing data and a loop back data storage section 16 that temporarily stores the loop back data from the loop back data transmission section and transmits the stored loop back data as incoming data in matching with the incoming transmission rate.</p>
申请公布号 JP2001168815(A) 申请公布日期 2001.06.22
申请号 JP19990346952 申请日期 1999.12.06
申请人 NEC CORP 发明人 ICHIKAWA HIDEKAZU
分类号 H04L29/14;H04B3/46;H04B17/02;H04J3/14;H04L12/26;(IPC1-7):H04B17/02 主分类号 H04L29/14
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