发明名称 SOCKET FOR TESTING
摘要 PROBLEM TO BE SOLVED: To provide a socket for testing which can be shared among packages to be tested of various sizes and enables to efficiently carry out various kinds of performance tests of packages to be tested. SOLUTION: Fixing positions of screws 8a and 8b for rod-shaped insulators 6a-6d in adjustment grooves 7a and 7b of a socket part 2 are selected, thereby forming a setting region which conforms to the size of a package 16 to be tested. In a state, where the packages 16 having various sizes can be set and the rod-shaped insulators 6a-6d of an elastic homogeneous extensibility are extended to make an interval of conductor sheet elements 15 agree with an interval of pins 18, when the interval of the pins 18 of the packages 16 is not a standard interval, the insulators 6a-6d are fixed by fixing holding tools 17 to a base 1. Packages 16 of various sizes and various pin intervals are thus set in common. A prescribed signal is impressed on each pin 18 by switching each of switches 5 of switch parts 3A and 3B. Prescribed performance tests can be carried out efficiently to the packages 16 at a low production cost and characteristics can be promptly evaluated surely.
申请公布号 JP2001165991(A) 申请公布日期 2001.06.22
申请号 JP19990349318 申请日期 1999.12.08
申请人 SONY CORP 发明人 ZOKURA HIDEJI
分类号 H01R33/76;G01R1/073;G01R31/26;(IPC1-7):G01R31/26 主分类号 H01R33/76
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