发明名称 |
MAGNETISM MEASURING DEVICE AND MAGNETISM MEASURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a magnetism measuring device and a magnetism measuring method by means of a magnetic impedance element capable of performing stable operation for changes of ambient temperature. SOLUTION: This magnetism measuring device carries a high frequency current to a magnetic impedance element whose impedance varies in accordance with intensity of a magnetic field when it is placed in the magnetic field and converts the current into a DC voltage by detecting phases of a terminal voltage of the element to measure intensity of the magnetic field. The device is featured by having a phase detecting and smoothing part for converting the terminal voltage of the element into the DC voltage by a switch operating in synchronization with a frequency of the high frequency current. The switch is a semiconductor switch using a junction transistor or FET.
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申请公布号 |
JP2001166021(A) |
申请公布日期 |
2001.06.22 |
申请号 |
JP19990348186 |
申请日期 |
1999.12.07 |
申请人 |
MITSUBISHI MATERIALS CORP |
发明人 |
YAMAMOTO OSAMU;SHIRATA TAKAHARU |
分类号 |
G01R33/02;(IPC1-7):G01R33/02 |
主分类号 |
G01R33/02 |
代理机构 |
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主权项 |
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地址 |
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