| 摘要 |
PROBLEM TO BE SOLVED: To provide a near-field optical microscope to detect the scattering light in an extensive angular range, and a cantilever used therefor by improving the structure of the cantilever. SOLUTION: In the near-field optical microscope comprising an incident means to allow the light to be incident on a sample, the cantilever having a probe and a probe holder with a tip of the probe disposed close to the sample, and an objective optical system to receive the scattering light derived from the incident light generated at the tip of the probe, the tip of the probe is in the field of view of the objective optical system without being covered.
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