| 摘要 |
PROBLEM TO BE SOLVED: To prevent deterioration of characteristics and production of noise caused by the case wherein an output PAD does not corresponds to an output frequency from a logic circuit, but to an output frequency from an A/D converter, since it is common that an apparatus is equipped with both analogue and digital circuits under the circumstances wherein an integrated circuit is formed as a system LSI in recent years, and in many cases, the output frequency from the A/D converter is higher than the output frequency from a logic circuit at its lag current, as the system gets complicated. SOLUTION: When testing a single A/D converter unit, a means of storage to once store data with high frequency outputted from the A/D converter is provided. After that, the data is read out with a high frequency corresponding to an output PAD. In this case, a means of storage owned by an apparatus in correspondence with a logic circuit is used for this purpose.
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