| 发明名称 |
Sequential correlated double sampling technique for CMOS area array sensors |
| 摘要 |
A CMOS area array sensor with reduced fixed pattern noise. Device threshold voltage variations are minimied using a Sequential Correlated Double Sampling technique in a column circuitry.
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| 申请公布号 |
US6248991(B1) |
申请公布日期 |
2001.06.19 |
| 申请号 |
US19980223165 |
申请日期 |
1998.12.30 |
| 申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
CHEN ZHILIANG JULIAN;DIERSCHKE EUGENE G. |
| 分类号 |
H04N5/217;H04N5/357;H04N5/365;H04N5/374;H04N5/3745;H04N5/378;(IPC1-7):H01L27/146 |
主分类号 |
H04N5/217 |
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