| 摘要 |
The test rig of a machine (1) includes a distributed exploitation of the test results, where the signals originating from the sensors (2) are ordered into a single signal, passing through a broad pass-band cable (6), via a common acquisition module (5). The computers (11, 12, 13) in association with miscellaneous display means (7, 8, 9, 10) search for the measurements which interest them on pre-set frames of the signal by using lists of relations contained in a host computer (12).
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