发明名称 COMBINED MEASURING SYSTEMS ON A CIRCULAR SUPPORT BASE
摘要 The invention relates to a device which enables two or more measuring systems to be combined on a circular support base. The invention further relates to a device for measuring or marking an angular sector in degrees, in "percent" of a circular diagram, in "percent" of a semi-circular diagram and for measuring or marking a segment. The device consists of a circular base (1) which has a circular hole in the center (2) and which is graduated in degrees on the periphery, from 0 to 360; a center (2) circle (3), which is graduated in "percent", from 0 to 100, and a recess (4). The semi-discs (21) of the centers (22) and (23) are removed from the circle (3), the semi-circular edge (24) is graduated in "percent", the semi-circular edge (25) is graduated in degrees and the rectilinear edges of the semi-discs (21) are in millimeters. The device according to the invention is particularly useful for pupils and teachers.
申请公布号 WO0142733(A1) 申请公布日期 2001.06.14
申请号 WO2000FR03373 申请日期 2000.12.04
申请人 SIBLINI, RAJA 发明人 SIBLINI, RAJA
分类号 B43L9/00;(IPC1-7):G01B3/56 主分类号 B43L9/00
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