发明名称 |
Apparatus and method for testing subscriber loop interface circuits |
摘要 |
<p>A method and apparatus for internally testing portions of a subscriber loop interface circuit. Testing is conducted on a semiconductor circuit including the subscriber loop interface circuit. The portion of the subscriber loop interface circuit being tested may be the ring trip detector and/or the off-hook detect circuit. Testing of may be conducted without disabling the capability of the subscriber loop interface circuit to monitor the hook status of a subscriber. <IMAGE></p> |
申请公布号 |
EP1107552(A2) |
申请公布日期 |
2001.06.13 |
申请号 |
EP19990124664 |
申请日期 |
1999.12.10 |
申请人 |
INTERSIL CORPORATION |
发明人 |
LUDEMAN, CHRISTOPHER |
分类号 |
H04M3/30;H04M3/00;(IPC1-7):H04M3/22;H04M19/00 |
主分类号 |
H04M3/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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