发明名称 Testing asynchronous circuits
摘要 A method and system for testing a circuit. A test program is downloaded into the circuit, which causes the circuit to provide a serial test output pattern comprising a series of identical signals to indicate whether the circuit passes the test. Signals of the test output pattern are compared against corresponding signals of an expected test output pattern only for non-masked signals of the expected test output pattern, wherein the expected test output pattern is masked for a maximum tolerable time period around an expected test output pattern start time.
申请公布号 US6246971(B1) 申请公布日期 2001.06.12
申请号 US19990225654 申请日期 1999.01.05
申请人 LUCENT TECHNOLOGIES INC. 发明人 KERMANI BAHRAM GHAFFARZADEH;SMURTHWAITE WILLIAM JAMES;VOMERO JAMES FRANK
分类号 G01R31/3185;(IPC1-7):G01R31/26 主分类号 G01R31/3185
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