| 摘要 |
An electrical contact for IC device (31) testing which provides good electrical contact without involving wiping action. This electrical contact comprises a first and second arm (40, 44) formed into a generally C-shaped segment and a hook segment (46) which protrudes from the C-shaped segment in a direction generally opposite the second arm (44). The first and the second is connected via a resilient neck (42). This contact can be adapted for use with an apparatus for electrically interconnecting a lead (33) of a test device to a terminal spaced at a distance from the lead.
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