发明名称 |
MANUFACTURING METHOD FOR THIN FILM MAGNETIC HEAD, INSPECTING DEVICE, AND INSPECTING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a manufacturing method capable of manufacturing a high performance thin film magnetic head, including an inspection process in which the track width can be measured with high accuracy in a short time. SOLUTION: This manufacturing method has a thin film forming process of forming a lamination film constituting the thin film magnetic head on a substrate, and an inspection process of measuring the size of a predetermined portion of the lamination film. In the inspection process, illuminating light having a wavelength of 400 nm or less is applied from a light source 7 to the lamination film and light from the lamination film is imaged on a CCD 24 by lens optical systems 13, 24. A calculator 27 measures the size from the image.
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申请公布号 |
JP2001153614(A) |
申请公布日期 |
2001.06.08 |
申请号 |
JP19990340134 |
申请日期 |
1999.11.30 |
申请人 |
HITACHI LTD |
发明人 |
YOSHIDA MINORU;NAKADA TOSHIHIKO;SASAZAWA HIDEAKI;YAMASAKA MINORU;KATO ATSUSHI;FURUSAWA KENJI |
分类号 |
G01B11/02;(IPC1-7):G01B11/02 |
主分类号 |
G01B11/02 |
代理机构 |
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