发明名称 SUBSTRATE FOR TESTING LEADLESS PACKAGE
摘要 PROBLEM TO BE SOLVED: To provide a substrate for testing which can surely prevent a pattern for testing from being cracked when a leadless package is tested. SOLUTION: Patterns for testing 12a, 13a and 12b, 13b are formed in a direction orthogonal to the arrangement direction of a plurality of leads at the leadless package 20, whereas the leading end parts of patterns for testing 11a, 14a, 11b and 14b to be electrically connected to leads 21a, 24a, 21b and 24b set at four corners of the package 20 are formed in a direction parallel to the lead arrangement direction. In the arrangement, since only a part of a curving pressure by pressuring from the package 20 acts to the patterns 11a, 14a, 11b and 14b when the package is tested, the patterns are prevented from being cracked. Even when the pressure acts in a state of this level at an electric contact time, conduction of the package can be checked with a sufficient accuracy.
申请公布号 JP2001153919(A) 申请公布日期 2001.06.08
申请号 JP19990333075 申请日期 1999.11.24
申请人 SONY CORP 发明人 KAKIMOTO KOZO
分类号 G01R31/28;G01R1/073;G01R31/26;(IPC1-7):G01R31/26 主分类号 G01R31/28
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