发明名称 HEAT TREATMENT EQUIPMENT FOR SEMICONDUCTOR WAFER
摘要 PROBLEM TO BE SOLVED: To provide inexpensive heat treatment equipment for a semiconductor wafer, in which the occurrence of slip can be prevented by improving the in- plane soaking property of a semiconductor wafer, and t the same time, the sizes of lamp heating sources can be reduced. SOLUTION: This heat treatment equipment for a semiconductor wafer has lamp heating sources 3 and 4, respectively arranged above and below a semiconductor wafer W and a heater heating source 5 which surrounds the wafer W separated a distance.
申请公布号 JP2001156011(A) 申请公布日期 2001.06.08
申请号 JP19990338575 申请日期 1999.11.29
申请人 TOSHIBA CERAMICS CO LTD 发明人 KUROKAWA MASAHIKO;SHIMOI NORIHIRO
分类号 H01L21/205;H01L21/26;H01L21/324;(IPC1-7):H01L21/26 主分类号 H01L21/205
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