发明名称 |
Laser beam inspection apparatus |
摘要 |
A laser beams inspection apparatus suitable for inspecting electronic components such as ICs mounted on a substrate. The inspection apparatus includes a scan mechanism. The scan mechanism works to move a laser beam emitted from a laser emitter to scan a target one of electronic components in a given scan range. The scan mechanism is designed to change orientation of emission of the laser beam to change the scan range as a function of the type (e.g., the size) of the target electronic component, thereby minimizing inspection errors regardless of the type of the electronic components to be inspected.
|
申请公布号 |
US2001002861(A1) |
申请公布日期 |
2001.06.07 |
申请号 |
US20000726596 |
申请日期 |
2000.12.01 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
ICHIKAWA IWAO |
分类号 |
G01N21/956;(IPC1-7):G01N21/00 |
主分类号 |
G01N21/956 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|