发明名称 |
FLASH MEMORY CELL AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A method for manufacturing a flash memory cell is provided to reduce a unit cell area and to improve reliability and high integration, by using a multi-level technique in the flash memory cell having two transistors and one cell. CONSTITUTION: A floating gate(43) is formed in a predetermined region of a semiconductor substrate(41) by interposing a tunneling oxide layer(42). An ONO layer(44,45,46) and a conductive layer are sequentially formed on the entire surface of the semiconductor substrate including the floating gate. The conductive layer and the ONO layer are selectively eliminated to simultaneously form a control gate and a gate electrode. A source/drain region is formed in the substrate of the semiconductor substrate on both sides of the gate electrode and the control gate.
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申请公布号 |
KR20010045232(A) |
申请公布日期 |
2001.06.05 |
申请号 |
KR19990048439 |
申请日期 |
1999.11.03 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHOI, JAE SEUNG;KIM, SEONG YEON;LEE, SANG BAE;SEO, JEONG HUN |
分类号 |
H01L27/115;(IPC1-7):H01L27/115 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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