发明名称 FLASH MEMORY CELL AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A method for manufacturing a flash memory cell is provided to reduce a unit cell area and to improve reliability and high integration, by using a multi-level technique in the flash memory cell having two transistors and one cell. CONSTITUTION: A floating gate(43) is formed in a predetermined region of a semiconductor substrate(41) by interposing a tunneling oxide layer(42). An ONO layer(44,45,46) and a conductive layer are sequentially formed on the entire surface of the semiconductor substrate including the floating gate. The conductive layer and the ONO layer are selectively eliminated to simultaneously form a control gate and a gate electrode. A source/drain region is formed in the substrate of the semiconductor substrate on both sides of the gate electrode and the control gate.
申请公布号 KR20010045232(A) 申请公布日期 2001.06.05
申请号 KR19990048439 申请日期 1999.11.03
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHOI, JAE SEUNG;KIM, SEONG YEON;LEE, SANG BAE;SEO, JEONG HUN
分类号 H01L27/115;(IPC1-7):H01L27/115 主分类号 H01L27/115
代理机构 代理人
主权项
地址