METHOD FOR TESTING INTEGRATED CIRCUIT BY AUTOMATIC TEST DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a method for testing an integrated circuit by using an automatic test device. SOLUTION: A series of timing or time plates for input pins and corresponding output pins is controlled by a timing generator in the automatic test device; when the number (n) of the time plates is larger than the number (m) of timing generators, a test is actualized in several steps and the timing generators are reused to implement other time plates in 2nd and succeeding steps. To minimize the test time, the timing generators reused in the 2nd step have programming modifications from the time plate implemented in the 1st step to the time plate implemented in the 2nd step carried out at a minimum frequency.