发明名称 METHOD AND APPARATUS FOR INTEGRATING METAL NITRIDE FILM WITH SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a substrate processing method for integrating metallic nitride film with a semiconductor device. SOLUTION: A dielectric layer is formed on the substrate. The dielectric layer is exposed in a first chamber to an active nitride atom formed in a second chamber, in order to form the dielectric layer passivated by nitride. The metallic film is successively formed on the dielectric layer passivated by nitride.
申请公布号 JP2001148380(A) 申请公布日期 2001.05.29
申请号 JP20000290804 申请日期 2000.09.25
申请人 APPLIED MATERIALS INC 发明人 NARWANKAR PRAVIN;SAHIN TURGUT
分类号 C23C16/34;C23C16/40;C23C16/46;H01L21/02;H01L21/28;H01L21/285;H01L21/31;H01L21/316;H01L21/768;H01L21/8242;H01L27/108;H01L29/423;H01L29/43;H01L29/49;H01L29/78 主分类号 C23C16/34
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