发明名称 METHODS OF TREATING SURFACE OF SILICON WAFER, MANUFACTURING ODORLESS SILICON WAFER, MANUFACTURING OXIDE FILM ON SILICON WAFER AND MANUFACTURING SILICON OXIDE WAFER, DEVICE FOR FORMING OXYGEN ACTIVE SPECIES ATMOSPHERE AND PLANARIZATION SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide methods of treating a surface of a silicon wafer, manufacturing a silicon wafer, forming an oxide film on a silicon wafer, manufacturing a silicon oxide wafer, a device for forming an oxygen active species atmosphere and a planarization system with which surface contamination can be removed from a silicon wafer whose surface is contaminated after local etching within a short time, and further contamination of a planarized silicon wafer can be prevented. SOLUTION: A sulfur hexafluoride gas supplied into a discharge tube 30 by a local etching gas supplier 4 is discharged to generate a fluorine active species G. This fluorine active species G is sprayed on a surface of a silicon wafer W via a nozzle section 30a to perform local etching. Then, an oxygen gas supplied into the discharge tube 30 by an oxygen gas supplier 5 is discharged to generate oxygen active species G1. By filling this oxygen active species G1 in a chamber 1, contamination of the locally etched silicon wafer W is removed or an oxide film is formed over the whole surface of the silicon wafer W.
申请公布号 JP2001144072(A) 申请公布日期 2001.05.25
申请号 JP19990320892 申请日期 1999.11.11
申请人 SPEEDFAM CO LTD 发明人 YANAGISAWA MICHIHIKO;SADOHARA TAKESHI
分类号 H01L21/302;H01J37/32;H01L21/3065;H01L21/316;(IPC1-7):H01L21/306 主分类号 H01L21/302
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