发明名称 |
METHOD FOR SORTING DEFECT ON BASIS OF PICKED-UP IMAGE AND METHOD FOR DISPLAYING THE RESULT |
摘要 |
PROBLEM TO BE SOLVED: To smoothly perform learning by shortening teaching time of learning by making a sorting system automatically control consistency between the sorting reference of a defect defined by a user and an image feature concerning a method for automatically sorting the defect on the basis of a picked-up image. SOLUTION: A user category designated by the user is temporarily sorted on the basis of the sub-category of low-order sorting with similarity in the features of images as a reference the images of respective defects. The similarity in the feature of this image is captured by a cluster for the distribution of feature amounts. As a result of sorting, the image of the defect is outputted with sorting based on the user category. |
申请公布号 |
JP2001134763(A) |
申请公布日期 |
2001.05.18 |
申请号 |
JP19990318421 |
申请日期 |
1999.11.09 |
申请人 |
HITACHI LTD |
发明人 |
TAKAGI YUJI;OBARA KENJI;NAKAGAKI AKIRA;OZAWA YASUHIKO;KUROSAKI TOSHISHIGE;ISOGAI SHIZUSHI |
分类号 |
G06F15/18;G06N3/00;G06T1/00;G06T7/00 |
主分类号 |
G06F15/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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