发明名称 METHOD FOR SORTING DEFECT ON BASIS OF PICKED-UP IMAGE AND METHOD FOR DISPLAYING THE RESULT
摘要 PROBLEM TO BE SOLVED: To smoothly perform learning by shortening teaching time of learning by making a sorting system automatically control consistency between the sorting reference of a defect defined by a user and an image feature concerning a method for automatically sorting the defect on the basis of a picked-up image. SOLUTION: A user category designated by the user is temporarily sorted on the basis of the sub-category of low-order sorting with similarity in the features of images as a reference the images of respective defects. The similarity in the feature of this image is captured by a cluster for the distribution of feature amounts. As a result of sorting, the image of the defect is outputted with sorting based on the user category.
申请公布号 JP2001134763(A) 申请公布日期 2001.05.18
申请号 JP19990318421 申请日期 1999.11.09
申请人 HITACHI LTD 发明人 TAKAGI YUJI;OBARA KENJI;NAKAGAKI AKIRA;OZAWA YASUHIKO;KUROSAKI TOSHISHIGE;ISOGAI SHIZUSHI
分类号 G06F15/18;G06N3/00;G06T1/00;G06T7/00 主分类号 G06F15/18
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