发明名称 SPECIMEN EXAMINING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a specimen examining apparatus capable of taking, for examination, a bright and clear image of particles to be examined formed on a slanted bottom part of each of wells. SOLUTION: This examining apparatus is equipped with a slanting mechanism E, a photographing device 20, and moving mechanisms 62, 88. The slanting mechanism E slants a micro plate 10 at a second angleβrelative to the horizon to cause the particles settled on the bottom part to flow out to a slope 101a. The plate 10 has the wells 101 each having a cylindrical side wall 101b, with one end opened and the other end closed by the bottom part, disposed like a matrix at specified pitches p1, p2 with the opened side oriented upward, and each having the slope 101a slanted at a first angleαrelative to the horizon. The device 20 photographs each slope 101a in the plate 10 placed substantially horizontally. The mechanisms 62, 88 move the plate 10 and the device 20 relative to each other. An optical axis 20AX of the device 20 is slanted relative to the vertical direction correspondingly to the slant of the first angleα. Slanting the optical axis corresponding to the slant of the first angle makes clear an image taken of the particles.
申请公布号 JP2001133397(A) 申请公布日期 2001.05.18
申请号 JP19990314601 申请日期 1999.11.05
申请人 FUJIREBIO INC 发明人 KINOSHITA YOSHIHIRO;SOMA KAZUNORI;SAITO TOMOO
分类号 G01B11/02;G01B11/24;G01N15/02;G01N21/03;G01N21/17;G01N21/84;G01N33/543;(IPC1-7):G01N21/17 主分类号 G01B11/02
代理机构 代理人
主权项
地址