发明名称 CMOS-COMPATIBLE MEM SWITCHES AND METHOD OF MAKING
摘要 A microelectromechanical (MEM) switch is fabricated inexpensively by using processing steps which are standard for fabricating multiple metal layer integrated circuits, such as CMOS. The exact steps may be adjusted to be compatible with the process of a particular foundry, resulting in a device which is both low cost and readily integrable with other circuits. The processing steps include making contacts for the MEM switch from metal plugs which are ordinarily used as viasto connect metal layers which are separated by a dielectric layer. Such contact vias are formed on either side of a sacrificial metallization area, and then the interconnect metallization is removed from between the contact vias, leaving them separated. Dielectric surrounding the contacts is etched back so that they protrude towards each other. Thus, when the contacts are moved towards each other by actuating the MEM switch, they connect firmly without obstruction. Tungsten is typically used to form vias in CMOS processes, and it makes an excellent contact material, but other via metals may also be employed as contacts. Interconnect metallization may be employed for other structural and interconnect needs of the MEM switch, and is preferably standard for the foundry and process used. Various metals and dielectric materials may be used to create the switches, but in a preferred embodiment the interconnect metal layers are aluminum and the dielectric material is Si>O2<, materials which are fully compatible with standard four-layer CMOS fabrication processes.
申请公布号 WO0135433(A2) 申请公布日期 2001.05.17
申请号 WO2000US23197 申请日期 2000.08.23
申请人 HRL LABORATORIES, LLC. 发明人 CHOW, LAP-WAI;HSU, TSUNG-YUAN;HYMAN, DANIEL, J.;LOO, ROBERT, Y.;OUYANG, PAUL;SCHAFFNER, JAMES, H.;SCHMITZ, ADELE;SCHWARTZ, ROBERT, N.
分类号 B81B3/00;B81C1/00;H01H1/021;H01H1/58;H01H49/00;H01H59/00;(IPC1-7):H01H50/00 主分类号 B81B3/00
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