发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PURPOSE: To provide a highly integrated high-performance semiconductor device by realizing a stable high-performance semiconductor element which is less in characteristic variation and a method, by which the semiconductor device can be manufactured easily at a high yield. CONSTITUTION: A TFT 123, formed on a glass substrate 101, contains a crystalline silicon film 108 as an active region. The film 108 is formed in such a way that, after a hydrogen-containing a-Si film 103 is formed on the glass substrate 101, nickel 104 is added to the surface of the film 103, and the surface of the film 103 carrying the added nickel 104 is heat-treated. The diameters of individual crystal grains in the crystalline silicon film 108 is smaller than those of individual crystal grains in the channel region of the TFT 123.
申请公布号 KR20010039906(A) 申请公布日期 2001.05.15
申请号 KR20000055461 申请日期 2000.09.21
申请人 SHARP CORPORATION 发明人 MAKITA NAOKI;MORIGUCHI MASAO
分类号 H01L21/205;H01L21/20;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/768;H01L29/786;(IPC1-7):H01L29/786 主分类号 H01L21/205
代理机构 代理人
主权项
地址