发明名称 PLASMA ETCHER
摘要 PURPOSE: A plasma etcher is provided to prevent a wafer from being damaged by ions irradiated to the wafer, by varying and applying a positive power supply and a negative power supply to positive and negative electrodes, respectively. CONSTITUTION: A wafer(230) is mounted between a positive electrode and a negative electrode. The wafer is etched by using plasma generated by a high voltage. BC(blocking capacitor) provide RF power source of which direct current and a low frequency component are eliminated, to a switch(100). The switch makes a positive power supply and a negative power supply varied and supplied to respective electrodes.
申请公布号 KR20010038944(A) 申请公布日期 2001.05.15
申请号 KR19990047134 申请日期 1999.10.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 YOON, JONG U
分类号 H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/3065
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