发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE USING ION IMPLANTING PROCESS
摘要 PURPOSE: A method for manufacturing a semiconductor device by using an ion implanting process is provided to easily control a junction depth and to prevent a wafer from being damaged by high energy ion implantation without using high energy ion implantation equipment. CONSTITUTION: Ion implantation processes for forming a well and a channel stop, preventing a punch-through and controlling a threshold voltage are carried out to manufacture a semiconductor device. After a silicon layer is respectively formed between the ion implantation processes, the next ion implantation process is performed. Low energy ion implantation equipment is utilized in the respective ion implantation processes.
申请公布号 KR20010038441(A) 申请公布日期 2001.05.15
申请号 KR19990046410 申请日期 1999.10.25
申请人 ANAM SEMICONDUCTOR., LTD. 发明人 PARK, GEUN SU
分类号 H01L21/265;(IPC1-7):H01L21/265 主分类号 H01L21/265
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