发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE USING ION IMPLANTING PROCESS |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device by using an ion implanting process is provided to easily control a junction depth and to prevent a wafer from being damaged by high energy ion implantation without using high energy ion implantation equipment. CONSTITUTION: Ion implantation processes for forming a well and a channel stop, preventing a punch-through and controlling a threshold voltage are carried out to manufacture a semiconductor device. After a silicon layer is respectively formed between the ion implantation processes, the next ion implantation process is performed. Low energy ion implantation equipment is utilized in the respective ion implantation processes.
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申请公布号 |
KR20010038441(A) |
申请公布日期 |
2001.05.15 |
申请号 |
KR19990046410 |
申请日期 |
1999.10.25 |
申请人 |
ANAM SEMICONDUCTOR., LTD. |
发明人 |
PARK, GEUN SU |
分类号 |
H01L21/265;(IPC1-7):H01L21/265 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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