发明名称 SYSTEM FOR MEASURING SYSTEM CHARACTERISTIC OF PCI BUS
摘要 PURPOSE: A PCI bus type system characteristics measurement system is provided to adjust parameters which it is possible to simulate, and to test a critical environment and a characteristics limit at an initial stage so that it can enhance a quality. CONSTITUTION: The system comprises an interface card(30), a controller(40), a display(50) and a setting module(60). The interface card(30) can be inserted into a PCI slot(20). The controller(40), installed in the interface card(30), reads or writes various offset value at a register of a main board(10). The display(50) displays the values read from the controller(40). The setting module(60) sets a register value of the main board(10) via the controller(40). The characteristics measurement system is inserted in the PCI slot(20), the controller reads the data stored in the register of the main board(10), and displays the read data on a screen. Then the user watches the offset value displayed on the screen, and changes the register value of the main board(10) via the setting module(60) if it is necessary to change the functions of peripherals.
申请公布号 KR20010038454(A) 申请公布日期 2001.05.15
申请号 KR19990046424 申请日期 1999.10.25
申请人 HYNIX SEMICONDUCTOR INC. 发明人 HONG, JEONG IL;PARK, GEUN U;PARK, GYEONG BAE
分类号 G06F11/30;(IPC1-7):G06F11/30 主分类号 G06F11/30
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