发明名称 |
USE OF SILICON GERMANIUM AND OTHER ALLOYS AS THE REPLACEMENT GATE FOR THE FABRICATION OF MOSFET |
摘要 |
PURPOSE: Use of silicon germanium and other alloys as the replacement gate for the fabrication of MOSFET is provided to manufacturing a MOSFET device wherein the source region and the drain region are formed before formation of the gate and allows the use of any type of gate dielectric material. CONSTITUTION: A method for fabricating a MOSFET structure on a substrate comprises the steps of: forming an island above a gate region in the substrate, island being formed of Si.sub.1-x Ge.sub.x, wherein x is in the range of about 0.05 to about 1.0; building a sidewall about island; forming a source region and a drain regions in the substrate; selectively removing the island without removing the sidewall, thereby leaving a void over the gate region; and filling the void with a gate structure.
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申请公布号 |
KR20010039964(A) |
申请公布日期 |
2001.05.15 |
申请号 |
KR20000057676 |
申请日期 |
2000.09.30 |
申请人 |
SHARP CORPORATION |
发明人 |
DAVID RUSSELL EVANS;DOUGLAS JAMES TUUTO;YAN-JUN MA;YOSHI ONO |
分类号 |
H01L21/28;H01L21/283;H01L21/336;H01L21/338;H01L21/8234;H01L21/8242;H01L21/8246;H01L21/8247;H01L27/105;H01L29/423;H01L29/43;H01L29/49;H01L29/78;H01L29/786;H01L29/788;H01L29/792;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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