| 摘要 |
PROBLEM TO BE SOLVED: To improve the processing efficiency when IC test data are outputted by enabling a complicated output format for the IC test data. SOLUTION: In the IC test data output system 1, a data processing means 10 receives IC inspection data in a batch from a memory IC, and the data is processed into data complying with respective output formats on the basis of respective programs matching the various output formats in an output device 30. After the processed data are transmitted to an output means corresponding to respective output formats, the data are briefly processed by means of the output means and transmitted to the output device 30, and then, the output device 30 outputs the IC test data.
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