ELECTRONIC CIRCUIT BOARD AND METHOD OF INSPECTION OF CONNECTION STATE OF THE SAME

摘要

PROBLEM TO BE SOLVED: To simplify the preparation of test data for inspecting the connection state between semiconductor integrated circuits elements and to make dispensable with a testing jig in inspection, thereby to reduce the manhours for inspection. SOLUTION: A test data generating part 107 in the semiconductor integrated circuits element 102 generates test data for checking only a connection state between the semiconductor integrated circuits elements to the other semiconductor integrated circuits element 103. A test data transfer part 109 in the element 103 transfers test data to other semiconductor integrated circuits element 104. A test data collating part 111 in the element 104 collates test data transferred with expected value data, and the collated result is displayed on a light emitting diode 106.