发明名称 |
METHOD OF FORMING METAL FILM BY USING ELECTROPLATING |
摘要 |
PURPOSE: A metal film forming method by using electroplating is provided to prevent voids within a contact hole by restricting seed layer from being melted by electrolyte. CONSTITUTION: An insulating film(24) is formed on a substrate(22). The insulating film(24) is etched to form a contact hole exposing a portion of the semiconductor substrate(22). TaN is deposited through CVD on the substrate(22) including the contact hole to form a barrier layer(26). A thin copper film is deposited on the barrier layer through PVD or CVD to form a seed layer(28). The substrate is loaded into a chamber, and current is applied between an anode and a cathode. The substrate is immerged into an electrolyte. A copper film(30) is deposited on the seed layer(28). Applying current is stopped and the substrate(22) is taken out of the electrolyte and unloaded from the chamber.
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申请公布号 |
KR20010036682(A) |
申请公布日期 |
2001.05.07 |
申请号 |
KR19990043791 |
申请日期 |
1999.10.11 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, MYEONG BEOM;MUN, GWANG JIN;PARK, BYEONG RYUL |
分类号 |
H01L21/24;(IPC1-7):H01L21/24 |
主分类号 |
H01L21/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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