发明名称 METHOD OF FORMING METAL FILM BY USING ELECTROPLATING
摘要 PURPOSE: A metal film forming method by using electroplating is provided to prevent voids within a contact hole by restricting seed layer from being melted by electrolyte. CONSTITUTION: An insulating film(24) is formed on a substrate(22). The insulating film(24) is etched to form a contact hole exposing a portion of the semiconductor substrate(22). TaN is deposited through CVD on the substrate(22) including the contact hole to form a barrier layer(26). A thin copper film is deposited on the barrier layer through PVD or CVD to form a seed layer(28). The substrate is loaded into a chamber, and current is applied between an anode and a cathode. The substrate is immerged into an electrolyte. A copper film(30) is deposited on the seed layer(28). Applying current is stopped and the substrate(22) is taken out of the electrolyte and unloaded from the chamber.
申请公布号 KR20010036682(A) 申请公布日期 2001.05.07
申请号 KR19990043791 申请日期 1999.10.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, MYEONG BEOM;MUN, GWANG JIN;PARK, BYEONG RYUL
分类号 H01L21/24;(IPC1-7):H01L21/24 主分类号 H01L21/24
代理机构 代理人
主权项
地址