发明名称 Electromagnetic wave analyzer apparatus
摘要 An electromagnetic wave analyzer which computes transitional behavior of electromagnetic waves, taking into account conductor losses in each metal part, without the computation being limited by the metal thickness or angular frequencies. An initialization unit initializes various calculation parameters such as metal thickness d, the number of meshes, mesh sizes, dielectric constant ∈ of each cell, permeability mu, and electrical conductivity sigma. An analyzing unit uses a finite difference time domain method to solve a given equation under a surface impedance boundary condition in which the surface impedance z(omega) of a metal part becomes to 1/dsigma when the skin depth delta approaches infinity (i.e., when the angular frequency omega approaches zero). The analyzing unit yields a solution that described the transitional behavior of electromagnetic waves and outputs it as a result data file. In this way, the analyzer of the present invention computes transitional behavior of electromagnetic waves, taking into account conductor losses in each metal part, without being affected by the thickness of the metal parts.
申请公布号 US6226599(B1) 申请公布日期 2001.05.01
申请号 US19970923970 申请日期 1997.09.08
申请人 FUJITSU LIMTED 发明人 NAMIKI TAKEFUMI
分类号 G01R29/08;(IPC1-7):G01R29/08 主分类号 G01R29/08
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