| 摘要 |
PROBLEM TO BE SOLVED: To provide a test circuit for an integrated circuit device with shortened testing time, reduced pattern length, and reduced number of external terminals. SOLUTION: This test circuit is set between first and second circuits to be tested for performing a test to the first and second circuits to be tested. It selects a first output signal outputted from the first circuit to be tested or a second output signal outputted from the second circuit to be tested or a test signal on the basis of a test mode signal inputted from the outside, temporarily stores the selected signal as data, selects the temporarily stored data or the second output signal on the basis of a second test mode signal and sets it to the first circuit to be tested, and selects the temporarily stored data or the first output signal on the basis of a third test mode signal and outputs it to the second circuit to be tested. |
