发明名称 Thermal conducting trench in a semiconductor structure and method for forming the same
摘要 The invention relates to a method of forming a trench filled with a thermally conducting material in a semiconductor substrate. In one embodiment, the method includes filling a portion of the trench with a thermally conducting material and patterning a contact to the thermally conducting material. The invention also relates to a semiconductor device. In one embodiment, the semiconductor device has a trench defining a cell region, wherein a portion of the trench includes a thermally conducting material, and a contact to the thermally conducting material. The invention further relates to a semiconductor device and a method of forming a semiconductor device with an interlayer dielectric that is a thermally conducting material.
申请公布号 US6222254(B1) 申请公布日期 2001.04.24
申请号 US19970829860 申请日期 1997.03.31
申请人 INTEL CORPORATION 发明人 LIANG CHUNLIN;DOYLE BRIAN S.
分类号 H01L21/762;H01L21/763;H01L23/367;H01L29/10;H01L29/417;H01L29/78;(IPC1-7):H01L29/72;H01L29/30 主分类号 H01L21/762
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