REAL-TIME INTERFEROMETRIC DEFORMATION ANALYSIS

摘要

A compact, portable real-time speckle interferometric deformation analysis system employing a 2+1 phase shifting method and a common path interferometer reduces the complexity of the system in that two photosensors are used, each to capture one of the time-critical phase shifted interference patterns. The two time-critical phase shifted interference patterns are captured simultaneously so that the system is vibration insensitive and can operate in a noisy environment such as the shop floor of a manufacturing plant. The system allows the user the selection of viewing a display hologram or a phase change image.